Nodes

FinTomo-RI is divided into different nodes with varying imaging capabilities and fields of expertise. Please see the list below for an overview and visit the website of each node for more information. The contact persons listed below are glad to help, too!

University of Oulu

Devices: ZEISS Xradia 610 Versa, Bruker Skyscan 1272

Expertise: Biomedical imaging, materials research, electronics imaging and analysis

Contact: Eeva Nevanranta, eeva.nevanranta@oulu.fi, +358-40-0231075

University of Helsinki

Devices: Bruker Skyscan 1272, Phoenix nanotom, Microdiffraction facility, Helsinki TLI phase contrast CT

Expertise: Biomedical imaging, materials research, method development

Contact: Heikki Suhonen, heikki.suhonen@helsinki.fi, +358-29-4150013

Website: https://blogs.helsinki.fi/micro-ct/

University of Jyväskylä

Devices: JTomo in-house built tomograph, Zeiss XRadia MicroXCT-400, Zeiss XRadia NanoXCT-100, JTomo-MV Megavoltage CT

Expertise: Materials research, in-situ studies, product troubleshooting

Contact: Arttu Miettinen, arttu.i.miettinen@jyu.fi, +358-40-5455830

Website: https://r.jyu.fi/x-ray-tomography-laboratory

University of Tampere

Devices: Zeiss XRadia MicroCT-400

Expertise: Biomedical imaging

Contact: Markus Hannula, markus.hannula@tut.fi, +358-40-8490025

Website: https://www.tuni.fi/en/research/x-ray-microtomography

University of Eastern Finland

Devices: Bruker Skyscan 1172, PET-CT (AIVI), StraTec pQCT Medizintechnik XCT 2000, Nikon XTH 225

Expertise: Contrast-enhanced imaging

Contact: Tuomo Silvast, tuomo.silvast@uef.fi, +358-50-4652892

Website: https://www.uef.fi/en/sib-labs-x-ray-tomography

LUT University (Lappeenranta campus)

Devices: Waygate phoenix Microme|x neo 180

Expertise: Electronics testing and failure analysis

Contact: Tommi Kärkkäinen, tommi.karkkainen@lut.fi, +358-40-1488341